• DocumentCode
    1693794
  • Title

    A novel, wafer-scale technology for addressing process and cost obstacles associated with underfilling FCOB

  • Author

    Burress, Robert V. ; Capote, M. Albert ; Lee, Yong-Joon ; Lenos, Howard A. ; Zamora, Jeffrey F.

  • Author_Institution
    Aguila Technol. Inc., San Marcos, CA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    389
  • Abstract
    This paper provides an update on development work underway to produce a novel wafer-scale packaging technology. The technology, referred to as multi-layer, wafer-scale encapsulation (MLWSE), relies on high performance polymers which are used in wafer-level encapsulation and subsequent electronic assembly processes. High-speed laser processing, which is used to produce the interconnection structure, is another integral aspect of this technology. We will describe the basic elements of the technology and present the current state of development with data from test assemblies. Also to be discussed are the potential technological/assembly benefits offered by the MLWSE technology and a summary of the results of a cost analysis comparing this technology to other HDI technologies.
  • Keywords
    chip-on-board packaging; encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; laser beam applications; wafer-scale integration; MLWSE; cost analysis; electronic assembly; flip-chip; high performance polymers; high-speed laser processing; interconnection structure; multi-layer wafer-scale encapsulation; underfilling FCOB; wafer-scale packaging technology; wafer-scale technology; Assembly; Costs; Electronics packaging; Encapsulation; Flip chip; Optical materials; Polymers; Space technology; Stress; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008125
  • Filename
    1008125