DocumentCode
1693816
Title
Influence of moisture absorption in uncured underfill materials
Author
Luo, Shijian ; Wong, C.P.
Author_Institution
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
390
Lastpage
397
Abstract
Underfill is used to fill the gap between the integrated circuit (IC) chip and the substrate to improve the solder joint fatigue life in a flip chip package. In order to improve underfilling process, wafer level underfill materials are being developed. Wafer level underfill materials will be applied onto silicon wafer, B-staged, and then individual chips are diced. A certain time later, the individual underfill coated chip is attached onto substrate and underfill is cured during assembly. Most underfills are based on epoxy cured with different hardeners. However, uncured or incompletely cured epoxy underfill can absorb moisture in the normal environment. This will be an important concern for wafer level underfill materials. This paper will present a systematic study on moisture absorption in uncured underfill based on epoxy cured with acid anhydride (methylhexahydrophthalic anhydride, MHHPA) and epoxy cured with non-acid anhydride curing agent. The influence of absorbed moisture on curing properties, thermomechanical property, and adhesion property of underfill after curing was investigated.
Keywords
adhesion; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; moisture; acid anhydride; adhesion property; curing properties; flip chip package; moisture absorption; nonacid anhydride curing agent; solder joint fatigue life; thermomechanical property; uncured underfill materials; underfilling process; wafer level underfill materials; Absorption; Assembly; Curing; Fatigue; Flip chip; Integrated circuit packaging; Moisture; Silicon; Soldering; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008126
Filename
1008126
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