• DocumentCode
    1693858
  • Title

    Double-layer no-flow underfill materials and process

  • Author

    Zhang, Zhuqing ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    404
  • Lastpage
    410
  • Abstract
    No-flow underfill has been invented and practised in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. CSP components are assembled using the double-layer no-flow underfill process. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. With high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation.
  • Keywords
    chip scale packaging; design of experiments; encapsulation; flip-chip devices; reflow soldering; reliability; thermal expansion; viscosity; CSP components; SiO2; coefficient of thermal expansion; design of experiment; double-layer no-flow underfill; flip-chip process; reflow profile; reliability; silica fillers; solder joint formation; solder wetting properties; underfill thickness; underfill viscosity; Assembly; Curing; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; Viscosity; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008128
  • Filename
    1008128