Title :
Lead-free compatible underfill materials for flip chip applications
Author :
Chee, Choong Kooi ; Chin, Yoong Tatt ; Sterrett, Terry ; He, Yi ; Sow, HP ; Manepali, Rahul ; Chandran, Dennis
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper focuses on underfill materials for lead-free applications. A series of lead-free compatible underfill materials using capillary flow and mold transfer technologies were evaluated. The evaluations consist of the characterization of their physical properties, assembly of test vehicles with these materials and the reliability stress test of the assembled units. The processing of these materials for assembly was correlated to their physical properties. The reliability issues of the underfill. materials observed at 260°C reflow temperature were highlighted. With the understanding of the materials physical properties and failure mechanisms, the quest for high temperature reflow underfill materials solution begins here.
Keywords :
adhesion; capillarity; environmental factors; flip-chip devices; fracture toughness; integrated circuit packaging; integrated circuit reliability; moulding; polymers; 260 C; capillary flow; failure mechanisms; flip chip applications; fracture toughness; high performance polymers; lead-free compatible underfill materials; liquid capillary underfill technology; mold transfer technologies; molded underfill technology; physical properties characterization; reflow temperature; reliability issues; reliability stress test; test vehicles; Assembly; Environmentally friendly manufacturing techniques; Failure analysis; Flip chip; Materials reliability; Materials testing; Mechanical factors; Stress; Temperature; Vehicles;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008130