DocumentCode :
1693964
Title :
Study and modeling of the curing behavior of no-flow underfill
Author :
Zhang, Zhuqing ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
432
Lastpage :
438
Abstract :
Starting with a promising no-flow underfill formulation, this paper seeks to develop a systematic methodology to study and model its curing behavior. A Differential Scanning Calorimeter (DSC) is used to characterize the heat flow during curing under isothermal and temperature ramp conditions. A modified autocatalytic model is developed with temperature-dependent parameters. The Degree of Cure (DOC) is calculated; compared with DSC experiments, the model gives a good prediction of DOC under different curing conditions. The temperature of the printed wiring board (PWB) during solder reflow is measured using thermocouples and the evolution of DOC of the no-flow underfill during a reflow process is calculated and compared with experimental results. A rheometer and a Fourier-Transform Infrared (FTIR) spectroscope are used to study the relation of the underfill gelation with the reaction mechanism. Rapid heating rate favors the etherification of the epoxy over the esterification between the epoxy and the anhydride. This causes the early gelation of the underfill.
Keywords :
differential scanning calorimetry; flip-chip devices; polymers; printed circuit manufacture; reflow soldering; spectrochemical analysis; viscosity; DSC; FTIR spectroscope; PWB temperature; curing behavior; degree of cure; early gelation; epoxy etherification; flip-chip process; heat flow; isothermal conditions; modified autocatalytic model; no-flow underfill; printed wiring board; rapid heating rate; reaction mechanism; rheometer; solder reflow; systematic methodology; temperature ramp conditions; temperature-dependent parameters; thermocouples; underfill gelation; Curing; Delay; Materials science and technology; Packaging; Resins; Semiconductor device modeling; Soldering; Temperature; Thermal stresses; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008132
Filename :
1008132
Link To Document :
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