DocumentCode :
1693998
Title :
Characterization of silicon nanowire transistor as a temperature nano-sensor device
Author :
Hashim, Y. ; Sidek, Othman
Author_Institution :
Collaborative Microelectron. Design Excellence Centre (CEDEC), Univ. Sci. Malaysia, Nibong Tebal, Malaysia
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
This paper represents the temperature characteristics of silicon nanowire transistor of rectangular cross-section, temperature effect on transfer characteristics, ION/1oFF ratio and sub-threshuld swing was studied. OMEN nanowire simulation tool was used to investigate temperature characteristics of transistor with three types of orientations. The findings of the current study reveal that <;111> and <;100> are the best types of orientations to be used in SiNWT for the temperature application of electronic circuits, such as digital circuits and amplifiers, because of the high ION/1oFF ratio and lower SS at these orientations. Moreover, the best orientation for temperature sensor was <;110> because of the larger carrier velocity and smaller channel resistance.
Keywords :
elemental semiconductors; nanoelectronics; nanosensors; nanowires; silicon; temperature sensors; transistors; OMEN nanowire simulation tool; Si; amplifiers; carrier velocity; channel resistance; digital circuits; electronic circuits; rectangular cross-section; silicon nanowire transistor characterization; subthreshuld swing; temperature characteristics; temperature effect; temperature nanosensor device; nano-sensor; nanowir; temperature; transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control System, Computing and Engineering (ICCSCE), 2012 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
978-1-4673-3142-5
Type :
conf
DOI :
10.1109/ICCSCE.2012.6487105
Filename :
6487105
Link To Document :
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