• DocumentCode
    1693998
  • Title

    Characterization of silicon nanowire transistor as a temperature nano-sensor device

  • Author

    Hashim, Y. ; Sidek, Othman

  • Author_Institution
    Collaborative Microelectron. Design Excellence Centre (CEDEC), Univ. Sci. Malaysia, Nibong Tebal, Malaysia
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper represents the temperature characteristics of silicon nanowire transistor of rectangular cross-section, temperature effect on transfer characteristics, ION/1oFF ratio and sub-threshuld swing was studied. OMEN nanowire simulation tool was used to investigate temperature characteristics of transistor with three types of orientations. The findings of the current study reveal that <;111> and <;100> are the best types of orientations to be used in SiNWT for the temperature application of electronic circuits, such as digital circuits and amplifiers, because of the high ION/1oFF ratio and lower SS at these orientations. Moreover, the best orientation for temperature sensor was <;110> because of the larger carrier velocity and smaller channel resistance.
  • Keywords
    elemental semiconductors; nanoelectronics; nanosensors; nanowires; silicon; temperature sensors; transistors; OMEN nanowire simulation tool; Si; amplifiers; carrier velocity; channel resistance; digital circuits; electronic circuits; rectangular cross-section; silicon nanowire transistor characterization; subthreshuld swing; temperature characteristics; temperature effect; temperature nanosensor device; nano-sensor; nanowir; temperature; transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control System, Computing and Engineering (ICCSCE), 2012 IEEE International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4673-3142-5
  • Type

    conf

  • DOI
    10.1109/ICCSCE.2012.6487105
  • Filename
    6487105