Title :
RLGS profile segmentation via a SVM
Author :
Nakamura, E. ; Murayama, N. ; Sawada, K. ; Okuizumi, H.
Author_Institution :
Dept. Inf. Network Eng., Aichi Inst. of Technol., Toyota, Japan
fDate :
6/23/1905 12:00:00 AM
Abstract :
This paper presents a new and fast segmentation algorithm, capable of incorporating expert´s knowledge and expertise in a straightforward manner, to detect DNA spots in a restriction landmark genomic scanning (RLGS) profile. A RLGS profile is a gray scale image obtained in a X-ray film containing hundreds of dark spots corresponding to certain DNA fragments labeled by radioactive markers. Extracting these DNA spots is a very challenging task due to their fuzzy boundaries against noisy background regions having non-uniform intensity variations. The proposed algorithm, utilizing a support vector machine, is found to be successful to detect and extract DNA spots in a RLGS profile
Keywords :
DNA; diagnostic radiography; feature extraction; image segmentation; knowledge verification; medical image processing; vector processor systems; DNA fragments; DNA spots detection; DNA spots extraction; RLGS profile segmentation; SVM; X-ray film; expert knowledge; fast segmentation algorithm; fuzzy boundaries; gray scale image; noisy background regions; nonuniform intensity variations; radioactive markers; restriction landmark genomic scanning; support vector machine; Agriculture; Aquaculture; Background noise; Content addressable storage; DNA; Forestry; Proposals; Support vector machines; Visualization; X-ray imaging;
Conference_Titel :
Image Processing, 2001. Proceedings. 2001 International Conference on
Conference_Location :
Thessaloniki
Print_ISBN :
0-7803-6725-1
DOI :
10.1109/ICIP.2001.959071
