Title :
An intelligent software-integrated environment of IC test
Author :
Sun, Yuning ; Wang, Xiaoming ; Shi, WanChun
Author_Institution :
Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Abstract :
The migration and simulation of IC test programs among the heterogeneous ATE systems are a very difficult task. An unifying IC test software-integrated environment from simulation to test for digital circuit has been developed. The environment, TeDS which is designed by using object-oriented paradigm, supports two kinds of CAD systems and three kinds of ATE (Automatic Test Equipment). The paper focuses on issues and techniques in developing TeDS based on object-oriented paradigm
Keywords :
automatic test software; circuit CAD; digital integrated circuits; electronic engineering computing; file organisation; integrated circuit testing; integrated software; object-oriented methods; ATE; CAD; IC test; TeDS; digital circuit; heterogeneous ATE systems; intelligent software-integrated environment; object-oriented paradigm; simulation; Circuit simulation; Circuit testing; Design automation; Digital circuits; Digital integrated circuits; Integrated circuit modeling; Integrated circuit testing; Object oriented modeling; Software testing; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528004
