Title :
Reliability of fiber optic datacom modules at Agilent Technologies
Author :
Herrick, Robert W.
Author_Institution :
Agilent Technol., San Jose, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
We discuss a number of measures taken by Agilent Technologies to ensure the reliability of our fiber optic transceivers. Our procedures for reliability qualification testing, identifying theoretical failure mechanisms, and controlling production are briefly discussed. The second half of the paper describes in some detail the corrosion failure mechanism observed in unprotected oxide VCSELs, and its dependence on environmental parameters. This mechanism is a potential source of concern in new non-hermetic fiber optic parallel transceivers when operated under high-humidity conditions. A number of potential avenues for future improvement, and recommended cautions in reliability testing, are detailed.
Keywords :
corrosion; data communication equipment; environmental degradation; failure analysis; humidity; modules; optical fibre communication; optical receivers; optical transmitters; production control; semiconductor device reliability; semiconductor device testing; semiconductor lasers; surface emitting lasers; transceivers; Agilent Technologies; corrosion failure mechanism; environmental parameters; failure mechanisms; fiber optic datacom modules; fiber optic transceivers; high-humidity conditions; nonhermetic fiber optic parallel transceivers; production control; reliability; reliability qualification testing; unprotected oxide VCSEL; Costs; Failure analysis; Optical fiber cables; Optical fibers; Optical receivers; Optical transmitters; Packaging; Testing; Transceivers; Vertical cavity surface emitting lasers;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008147
