• DocumentCode
    1694776
  • Title

    A hybrid fault simulator for synchronous sequential circuits

  • Author

    Krieger, R. ; Becker, B. ; Keim, M.

  • Author_Institution
    J.W. Goethe Univ., Frankfurt, Germany
  • fYear
    34608
  • Firstpage
    614
  • Lastpage
    623
  • Abstract
    Fault simulation for synchronous sequential circuits is a very time-consuming task. The complexity of the task increases if there is no information available about the initial state of the circuit. In this case, an unknown initial state is assumed which is usually handled by introducing a three-valued logic. It is known that fault simulation based upon this logic only determines a lower bound for the fault coverage achieved by a test sequence. Therefore, we developed a hybrid fault simulator H-FS combining the advantages of a fault simulator using the three-valued logic and of an exact symbolic fault simulator based upon binary decision diagrams. H-FS is able to handle even the largest benchmark circuits and thereby determines fault coverages much more accurately than previous algorithms using the three-valued logic
  • Keywords
    automatic test equipment; fault diagnosis; logic testing; performance evaluation; sequential circuits; ternary logic; benchmark circuits; binary decision diagrams; fault coverages; fault simulation; hybrid fault simulator; initial state; symbolic fault simulator; synchronous sequential circuits; test sequence; three-valued logic; Benchmark testing; Boolean functions; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer science; Data structures; Logic testing; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1994. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2103-0
  • Type

    conf

  • DOI
    10.1109/TEST.1994.528006
  • Filename
    528006