DocumentCode :
1694843
Title :
[Title page i]
fYear :
2009
Abstract :
The following topics are dealt with: emerging memories; advanced memory device and design; 3D memory technology; and memory modeling and testing.
Keywords :
memory architecture; 3D memory technology; advanced memory design; advanced memory device; memory modeling; memory testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location :
Hsinchu
Print_ISBN :
978-0-7695-3797-9
Type :
conf
DOI :
10.1109/MTDT.2009.1
Filename :
5280062
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1694843