DocumentCode
1694843
Title
[Title page i]
fYear
2009
Abstract
The following topics are dealt with: emerging memories; advanced memory device and design; 3D memory technology; and memory modeling and testing.
Keywords
memory architecture; 3D memory technology; advanced memory design; advanced memory device; memory modeling; memory testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location
Hsinchu
Print_ISBN
978-0-7695-3797-9
Type
conf
DOI
10.1109/MTDT.2009.1
Filename
5280062
Link To Document