Title :
Digital and RF integration in system-on-a-package (SOP)
Author :
Sundaram, Venky ; Liu, Fuhan ; Dalmia, Sidharth ; Hobbs, Joseph ; Matoglu, Erdem ; Davis, Mekita ; Nonaka, Toshihisa ; Laskar, Joy ; Swaminathan, Madhavan ; White, George E. ; Tummala, Rao R.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
The Packaging Research Center (PRC) is developing system-on-a-package (SOP) technology, as a complimentary alternative to SOC, as the fundamental building block for next generation convergent systems with computing, telecom and consumer capabilities with data and voice. Any systems of this nature have to provide not only high-speed digital, but also high bandwidth optical, analog, RF and perhaps MEMS functions. The SOP technology being pursued at PRC with embedded digital, optical and RF functions addresses this need, optimizing the IC and the package for functions, performance, cost, size and reliability. The PRC is developing this complimentary alternative to SOC using a three tier strategy consisting of fundamental research innovations, enabling technology developments and system-level testbeds. Individual digital, optical and RF testbeds have been developed to enable the integration of novel packaging technologies like embedded passive and optical components, high density global interconnections and wafer level flip-chip assembly. A phased system testbed is being evolved from these three testbeds to develop new SOP convergent system platforms for a digital/optical/RF system implementation. This paper summarizes the latest PRC accomplishments in the development of SOP baseline processes and system testbeds and updates the progress from basic research and technology integration to system testbeds for SOP.
Keywords :
digital integrated circuits; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit testing; integrated optoelectronics; multichip modules; radio equipment; semiconductor device packaging; IC package optimization; MEMS; SOC alternative; SOP; SOP system testbeds; analog functions; computing capabilities; convergent system building blocks; data/voice consumer capabilities; digital/optical/RF integration; embedded RF functions; embedded optical components; embedded passive components; high bandwidth optical functions; high density global interconnections; high-speed digital functions; system-level testbeds; system-on-a-package technology; telecom capabilities; wafer level flip-chip assembly; Bandwidth; High speed optical techniques; Micromechanical devices; Optical devices; Optical interconnections; Packaging; Partial response channels; Radio frequency; System testing; Telecommunication computing;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008164