Title :
Evaluation of liquid crystal polymers for high performance SOP application
Author :
Brownlee, Kellee ; Raj, P. Markondeya ; Bhattacharya, Swapan K. ; Shinotani, Ken-Ichi ; Wong, C.P. ; Tummala, Rao R.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Electronic devices increasingly rely on new materials with improved properties such as lower coefficient of thermal expansion (preferably close to silicon), higher modulus, lower permittivity and dielectric loss, lower moisture absorption better thermal conductivity, higher dimensional stability, and most importantly reduced warpage particularly after the build-up process. Liquid crystal polymers (LCPs) have led to increasing interest for the packaging community due to their superior thermal and electrical properties. The targeted applications areas for LCPs are RF packaging, due to their low loss and low dielectric constant over a wide frequency range (Fukutake and Inoue, 2002; Fukutake, 1998; Jayaraj et al, 1995; Lawrence, 2000; Jayaraj et al, 1996; Yue et al, 1999,), near hermitic plastic sealing due to superior moisture barrier properties (Jayaraj et al, 1997), flex circuits and microvia laminates for high density interconnection (Corbett et al, 2000; Yue and Chan, 1998). This paper is focused toward possible application of LCP as a dielectric material for lamination on PWB and other engineered organic substrates. Commercially available LCP samples were analyzed using a variety of thermal analysis techniques. Based on thermal properties such as coefficient of thermal expansion (CTE), thermal degradation temperature and modulus, samples were selected for applications as a dielectric material. It is expected that a low CTE dielectric such as LCP will further reduce the dielectric film stress even when the CTE of the chip is matched with that of the substrate.
Keywords :
dielectric thin films; integrated circuit packaging; internal stresses; laminates; liquid crystal polymers; thermal expansion; thermal stresses; CTE; LCP; LCP dielectric material; RF packaging; SOP application; build-up process; coefficient of thermal expansion; dielectric constant; dielectric film stress; dielectric loss; dielectric material; dimensional stability; electrical properties; electronic devices; engineered organic substrates; flex circuits; frequency range; high density interconnection; lamination; liquid crystal polymers; low CTE dielectric; material modulus; microvia laminates; moisture absorption; moisture barrier properties; near hermitic plastic sealing; packaging; permittivity; thermal analysis techniques; thermal conductivity; thermal degradation temperature; thermal modulus; thermal properties; warpage; Conducting materials; Crystalline materials; Dielectric losses; Dielectric materials; Dielectric substrates; Electronic packaging thermal management; Liquid crystal polymers; Moisture; Thermal conductivity; Thermal expansion;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008170