Title :
Detect abnormalities in mammograms by local contrast thresholding and rule-based classification
Author :
Nguyen, Viet Dzung ; Thu Van Nguyen ; Nguyen, Tien Dzung ; Nguyen, Duc Thuan ; Hong Van Hoang
Author_Institution :
Fac. of Electron. & Telecommun., Hanoi Univ. of Technol., Hanoi, Vietnam
Abstract :
Mammography, which uses X-ray technology to image the breast, is currently the most effective and reliable method for early cancer detection. There exists limitations of human observers: up 30% of breast lessions are missed during routine screening. It is believed that computer-aided detection (CAD) schemes could ultimately provide a useful “second option” for radiologists and potentially improve their diagnostic accuracy. The proposed detection process bases on local contrast thresholding and rule-based classification which is performed over the preprocessed and segmented mammograms. A relatively high detection rate of suspicious abnormal regions (mass and/or microcalcification) on the testing set of mammograms from Mini Mias Database implies that the proposed method can assist technologists in more efficiently and accurately locating the exact areas for subsequent exams.
Keywords :
X-ray imaging; image classification; image segmentation; knowledge based systems; mammography; medical image processing; object detection; patient diagnosis; Mini Mias Database; X-ray technology; computer aided detection; local contrast threshold; mammogram abnormality detection; mammography; rule based classification; segmented mammogram; computer-aided detection; local contrast thresholding; mammography; rule-based classification;
Conference_Titel :
Communications and Electronics (ICCE), 2010 Third International Conference on
Conference_Location :
Nha Trang
Print_ISBN :
978-1-4244-7055-6
DOI :
10.1109/ICCE.2010.5670711