• DocumentCode
    1695736
  • Title

    OFDM Channel Estimation with Optimal Threshold-Based Selection of CIR Samples

  • Author

    Rosati, Stefano ; Corazza, Giovanni E. ; Vanelli-Coralli, Alessandro

  • Author_Institution
    DEIS, Univ. of Bologna, Bologna, Italy
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper, we address the problem of OFDM data-aided channel estimation based on the selection of the most significant samples (MSS) of the channel impulse response (CIR), i.e. those samples which contain most of the useful energy. We provide a novel and complete analytical characterization for MSS selection based on threshold crossing, which yields a closed form for the estimate mean-square error (MSE), that we use to derive analytically the optimum threshold in the minimum MSE sense. The optimum threshold value is matched to the specific channel power profile, but this information is hardly available to the receiver. For these reason, we also propose a suboptimal method for threshold setting that does not require any knowledge of channel statistics. We show that the performance of this sub-optimal method is very close to the optimum case, as well as to Wiener channel estimation in the case of sparse multipath channels. Our proposed method outperforms previous approaches based on heuristically set thresholds.
  • Keywords
    OFDM modulation; channel estimation; mean square error methods; multipath channels; radio receivers; CIR samples; OFDM channel estimation; Wiener channel estimation; channel impulse response; channel statistics; data-aided channel estimation; mean square error; most significant samples; optimal threshold based selection; radio receiver; sparse multipath channels; sub-optimal method; Bandwidth; Channel estimation; Computational complexity; Delay; Discrete Fourier transforms; Equalizers; Frequency domain analysis; OFDM; Statistics; Wiener filter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1930-529X
  • Print_ISBN
    978-1-4244-4148-8
  • Type

    conf

  • DOI
    10.1109/GLOCOM.2009.5425939
  • Filename
    5425939