DocumentCode :
1696135
Title :
Modeling and characterization of wire bonding for RF applications
Author :
Lu, Albert Chee W ; Fan, Wei ; Wai, Lai L. ; Low, Lee A. ; Ke, Fei X. ; Yip, Kok C. ; Lim, Yak P.
Author_Institution :
Electron. Packaging Dept., Gintic Inst. of Manuf. Technol., Singapore, Singapore
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
905
Lastpage :
909
Abstract :
This paper describes a design methodology for improving the electrical performance of wire bonding. Adjacent power or ground wires are used to provide return paths in a coplanar configuration, thereby minimizing impedance mismatch. Design space exploration based on full-wave electromagnetic analysis is performed to achieve an optimized topology. The methodology has been demonstrated for both parallel and fanout bonding topologies for high frequencies up to 10 GHz. With advances in wire bonding technology, particularly fine pitch bonding, a coplanar configuration is highly feasible. The proposed methodology can be applied to lead frame, leadless chip carrier, COB and advanced BGA packages.
Keywords :
ball grid arrays; circuit simulation; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; lead bonding; losses; 10 GHz; BGA packages; COB; IC packaging; coplanar configuration; electrical performance; fanout bonding; fine pitch bonding; ground wires; impedance mismatch; insertion losses; lead frame; leadless chip carrier; optimized topology; return losses; up to 10 GHz; wire bonding; Bonding; Design methodology; Design optimization; Electromagnetic analysis; Impedance; Radio frequency; Space exploration; Space technology; Topology; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008207
Filename :
1008207
Link To Document :
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