• DocumentCode
    1696242
  • Title

    Ultra high dielectric constant epoxy silver composite for embedded capacitor application

  • Author

    Rao, Yang ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    920
  • Lastpage
    923
  • Abstract
    Embedded capacitor technology can increase silicon packaging efficiency, improve electrical performance, and reduce electronic assembly cost compared with traditional discrete capacitor technology. Developing a suitable material that satisfies electrical, reliability and processing requirements is one of the major challenges of incorporating capacitors into a printed wiring board (PWB) for demanding wireless, RF portable telecommunication products. A novel epoxy-based composite with very ultra high dielectric constant (εr∼1000) has been developed in this work. The previous record of εr=150 was only recently reported. To our best knowledge, this is the highest K value of the polymer-based composite ever reported. High dielectric constant is obtained by increasing the concentration of conductive filler close to but not exceed the percolation threshold within the polymer matrix. This novel ultra high K material also has low dielectric loss (<0.02), good adhesion and perfect multi-chip-module laminate (MCM-L) process compatibility. This novel composite is the perfect material candidate for the integral embedded capacitor applications for next generation electronic products.
  • Keywords
    adhesion; capacitors; dielectric losses; filled polymers; percolation; permittivity; silver; Ag; MCM-L process; adhesion; dielectric constant; dielectric loss; electronic product; epoxy silver composite; filled polymer; integral embedded capacitor; percolation threshold; ultra high K material; Capacitors; Conducting materials; Dielectric losses; Dielectric materials; Electronics packaging; High K dielectric materials; High-K gate dielectrics; Polymers; Silicon; Silver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008210
  • Filename
    1008210