DocumentCode :
1696340
Title :
Understanding lead frame surface treatment and its impact on package reliability
Author :
Renyi Wang ; Bing Wu
Author_Institution :
Ablestik Labs., Rancho Dominguez, CA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
947
Lastpage :
954
Abstract :
Lead frame micro-electronic packages are still the most widely used in the semiconductor industry. The surface properties of metal lead frames are involved in several important interfacial interactions within micro-electronic packages and hence have crucial impact on package integrity and reliability. In this work, detailed investigations were carried out to elucidate the chemical compositions of surface treatment solutions as well as the chemical and physical properties of lead frame surfaces. Results from 1H nuclear magnetic resonance (NMR), X-ray photoelectron spectroscopy (XPS), optical microscopy, and static secondary ion mass spectroscopy (SSIMS) are described. Adhesion testing data obtained from lead frames with different surface treatments, and with die attach adhesives of various chemistries, are reported. In addition, JEDEC reliability tests, using a new die attach adhesive, were performed on molded packages with different packaging material combinations and the results are reported.
Keywords :
X-ray photoelectron spectra; adhesion; integrated circuit packaging; optical microscopy; proton magnetic resonance; reliability; secondary ion mass spectra; surface treatment; 1H nuclear magnetic resonance; X-ray photoelectron spectroscopy; adhesion; chemical composition; die attach adhesive; interfacial interaction; lead frame; microelectronic package; optical microscopy; reliability; static secondary ion mass spectroscopy; surface treatment; Chemicals; Electronics industry; Lead compounds; Mass spectroscopy; Microassembly; Nuclear magnetic resonance; Optical microscopy; Particle beam optics; Semiconductor device packaging; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008215
Filename :
1008215
Link To Document :
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