Title :
Design of RCD snubbers based upon approximations to the switching characteristics. II. Simulation and experimental results
Author :
Hossain, Zia ; Olejniczak, K.J. ; Burgers, K.C. ; Balda, J.C.
Author_Institution :
Dept. of Electr. Eng., Arkansas Univ., Fayetteville, AR, USA
Abstract :
A theoretical analysis of the switching behavior of the MOS-controlled thyristor (MCT), with and without stray inductances present, under different snubbering conditions has been presented in a companion paper. In order to verify these theoretical results, a hard-switched experimental test circuit was constructed. In this paper, a comparison is made among the newly-derived analytical, PSpice simulation and experimental results
Keywords :
MOS-controlled thyristors; SPICE; circuit analysis computing; circuit breakers; power semiconductor switches; residual current devices; semiconductor device testing; snubbers; software packages; switching circuits; MCT; MOS-controlled thyristor; PSpice simulation; RCD snubber design; hard-switched experimental test circuit; snubbering conditions; stray inductance; switching characteristics; Analytical models; Circuit simulation; Circuit testing; Energy loss; Semiconductor device testing; Snubbers; Switches; Switching circuits; Switching loss; Voltage;
Conference_Titel :
Electric Machines and Drives Conference Record, 1997. IEEE International
Conference_Location :
Milwaukee, WI
Print_ISBN :
0-7803-3946-0
DOI :
10.1109/IEMDC.1997.604254
