Design of RCD snubbers based upon approximations to the switching characteristics. II. Simulation and experimental results

Author

Hossain, Zia ; Olejniczak, K.J. ; Burgers, K.C. ; Balda, J.C.

Author_Institution

Dept. of Electr. Eng., Arkansas Univ., Fayetteville, AR, USA

fYear

1997

Abstract

A theoretical analysis of the switching behavior of the MOS-controlled thyristor (MCT), with and without stray inductances present, under different snubbering conditions has been presented in a companion paper. In order to verify these theoretical results, a hard-switched experimental test circuit was constructed. In this paper, a comparison is made among the newly-derived analytical, PSpice simulation and experimental results

Keywords

MOS-controlled thyristors; SPICE; circuit analysis computing; circuit breakers; power semiconductor switches; residual current devices; semiconductor device testing; snubbers; software packages; switching circuits; MCT; MOS-controlled thyristor; PSpice simulation; RCD snubber design; hard-switched experimental test circuit; snubbering conditions; stray inductance; switching characteristics; Analytical models; Circuit simulation; Circuit testing; Energy loss; Semiconductor device testing; Snubbers; Switches; Switching circuits; Switching loss; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electric Machines and Drives Conference Record, 1997. IEEE International

Conference_Location

Milwaukee, WI

Print_ISBN

0-7803-3946-0

Type

conf

DOI

10.1109/IEMDC.1997.604254

Filename

604254