• DocumentCode
    1696808
  • Title

    Systematic deembedding of the transmission line parameters on high-density substrates with probe-tip calibrations

  • Author

    Grzyb, Janusz ; Cottet, Didier ; Tröster, Gerhard

  • Author_Institution
    Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1051
  • Lastpage
    1057
  • Abstract
    Three procedures allowing the systematic determination of the propagation characteristic of lines and deembedding the influence of feeding discontinuities are presented. All of them are based on the known measurement technique of two lines with different lengths on the measured substrate after earlier calibration with standard substrate. The first one allows arbitrary position of the probe tips along the lines. In effect equivalent element models of error boxes representing the feeding discontinuities don´t have to be lumped models. The second one is a modified procedure, wherein the probe-tip discontinuity error box is modeled by RLCG element. This new formulation allows to omit one of the limitations of the S-matrix asymmetry of an arbitrary reciprocal junction. This limitation is a complex characteristic impedance of the measured lines. The third procedure allows to determine the characteristic impedance of the lines with the wider or narrower pitch than that of the used probes. The complex propagation constant and characteristic impedance have been determined for lines on fused silica substrate up to 110 GHz and error box models have been verified up to this frequency range.
  • Keywords
    S-parameters; calibration; coplanar waveguides; microwave measurement; millimetre wave measurement; probes; waveguide discontinuities; waveguide junctions; 0 to 110 GHz; CPW; RLCG element; S-parameter measurements; arbitrary reciprocal junction; complex characteristic impedance; complex propagation constant; equivalent element models; error boxes; feeding discontinuities; fused silica substrate; high-density substrates; measurement system; probe-tip calibrations; propagation characteristic; systematic deembedding; transmission line parameters; Calibration; Impedance measurement; Length measurement; Measurement standards; Measurement techniques; Probes; Propagation constant; Transmission line discontinuities; Transmission line measurements; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008232
  • Filename
    1008232