DocumentCode
1696956
Title
Digitizer error extraction in the nonlinearity test
Author
Hsieh, Luke S L ; Kumar, Sandeep P.
Author_Institution
AT&T Bell Labs., Allentown, PA, USA
fYear
34608
Firstpage
757
Lastpage
762
Abstract
Measuring distortion using sources and digitizers that are nonlinear presents a difficult testing problem. A novel test method using digital signal processing (DSP) techniques is presented to address the error of the digitizer. A Taylor series representation is used to model the distorted digitizer and the device under test (DUT). A set of simultaneous equations can be constructed by considering the frequency contents of the digitized signal. These simultaneous equations can be solved to eliminate the error of the digitizer and give the nonlinearity of the DUT by itself. Additive Gaussian noise is assumed when analyzing errors in computation and during data acquisition. Simulation and experimental results support the analysis
Keywords
Gaussian noise; analogue-digital conversion; digital simulation; electronic equipment testing; error analysis; production testing; quantisation (signal); series (mathematics); Taylor series; additive Gaussian noise; data acquisition; device under test; digital signal processing; digitizer error extraction; distorted digitizer; error; frequency contents; nonlinearity test; simulation; simultaneous equations; Additive noise; Digital signal processing; Distortion measurement; Error analysis; Frequency; Gaussian noise; Nonlinear distortion; Nonlinear equations; Taylor series; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528022
Filename
528022
Link To Document