• DocumentCode
    1696969
  • Title

    GHz Asynchronous SRAM in 65nm

  • Author

    Dama, Jonathan ; Lines, Andrew

  • Author_Institution
    Fulcrum Microsyst., Calabasas, CA
  • fYear
    2009
  • Firstpage
    85
  • Lastpage
    94
  • Abstract
    This paper details the design of > 1 GHz pipelined asynchronous SRAMs in TSMC´s 65 nm GP process. We show how targeted timing assumptions improve an otherwise quasi delay-insensitive (QDI) design. The speed, area, and power of our SRAMs are compared to commercially available synchronous SRAMs in the same technology. We also present novel techniques for implementing large pseudo dual-ported memories that support simultaneous reads and writes. The most sophisticated of three designs yields a fully provisioned dual-ported memory using multiple single-ported banks connected by dual-ported buses, plus a small side-band memory to avoid bank conflicts. We discuss our solutions for manufacturing defects, soft-errors, and analog robustness with attention to .advantages and challenges of our asynchronous methodology. Laboratory measurements of a test-chip demonstrate correct functionality at speeds well over a GHz. Our single-ported SRAM designs are larger but faster than the alternate synchronous designs, while our novel dual-ported implementations can be both smaller and much faster. These technology advantages lead directly to competitive advantages for our future commercial products.
  • Keywords
    SRAM chips; asynchronous circuits; integrated circuit design; dual-ported buses; multiple single-ported banks; pipelined asynchronous SRAMs; pseudo dual-ported memories; quasi delay-insensitive design; side-band memory; Asynchronous circuits; Delay; Frequency; Logic; Manufacturing; Pipeline processing; Random access memory; Robustness; Testing; Timing; 65nm; DFT; ECC; Fulcrum Microsystems; QDI; SRAM; asynchronous; dual-ported; register-file; test-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asynchronous Circuits and Systems, 2009. ASYNC '09. 15th IEEE Symposium on
  • Conference_Location
    Chapel Hill, NC
  • ISSN
    1522-8681
  • Print_ISBN
    978-1-4244-3933-1
  • Type

    conf

  • DOI
    10.1109/ASYNC.2009.23
  • Filename
    5010339