• DocumentCode
    1696975
  • Title

    Larger-than-Vdd forward body bias in sub-0.5V nanoscale CMOS

  • Author

    Ananthan, Hari ; Kim, Chris H. ; Roy, Kaushik

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2004
  • Firstpage
    8
  • Lastpage
    13
  • Abstract
    This paper examines the effectiveness of larger-than-Vdd forward body bias (FBB) in nanoscale bulk CMOS circuits where Vdd is expected to scale below 0.5V. Equal-to and larger-than Vdd FBB schemes offer unique advantages over conventional FBB such as simple design overhead and reverse body bias capability respectively. Compared to zero body bias, they improve process-variation immunity and achieve 71% and 78% standby leakage savings at iso performance and iso active power at room temperature. We also suggest a novel temperature-adaptive body bias scheme to control active leakage and achieve 22% and 40% active power savings at higher temperatures.
  • Keywords
    CMOS digital integrated circuits; integrated circuit design; leakage currents; low-power electronics; nanoelectronics; active leakage; active power savings; larger-than-Vdd forward body bias; nanoscale bulk CMOS circuits; process variations; process-variation immunity; reverse body bias capability; simple design overhead; standby leakage savings; sub-threshold leakage; technology scaling; temperature-adaptive body bias; CMOS logic circuits; Immune system; Logic circuits; Logic design; MOS devices; MOSFET circuits; Permission; Power MOSFET; Temperature control; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
  • Print_ISBN
    1-58113-929-2
  • Type

    conf

  • DOI
    10.1109/LPE.2004.1349299
  • Filename
    1349299