Title :
An on-line data collection and analysis system for VLSI devices at wafer probe and final test
Author :
Papadeas, Gregory W. ; Gauthier, David
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Abstract :
This paper describes a flexible software system for the collection of parametric, functional pattern fail, and bitmap data on-line during production testing of VLSI devices. The data is automatically loaded into a relational database for subsequent analysis by process and yield improvement software. The user can control the type and amount of data that is collected at each stage of a product´s life. By enabling data collection on every test, the same system can be used for engineering and debug analysis
Keywords :
VLSI; automatic testing; circuit analysis computing; data acquisition; integrated circuit testing; integrated circuit yield; production testing; relational databases; IC testing; VLSI devices; data collection; debug analysis; final test; flexible software system; functional pattern; online data collection; parametric pattern; production testing; wafer probe; Control systems; Data analysis; Data engineering; Databases; Optical control; Probes; Production systems; Software testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528024
