• DocumentCode
    1697163
  • Title

    Silicon carbide microfabrication by silicon lost molding for glass press molds

  • Author

    Itoh, T. ; Tanaka, S. ; Jing-Feng Li ; Watanabe, R. ; Esashi, M.

  • Author_Institution
    Dept. of Mechatronics Precision Eng., Tohoku Univ., Sendai, Japan
  • Volume
    1
  • fYear
    2003
  • Firstpage
    254
  • Abstract
    Two novel silicon carbide (SiC) microfabrication processes for SiC glass-press molds were developed. One is silicon lost molding combined with SiC chemical vapor deposition (CVD) and SiC reaction-sintering (RS). A SiC film was deposited on a micromachined silicon mold, and backed with a SiC reaction-sintered body. The surface roughness of the SiC mold was 0.05-0.08 /spl mu/m Ra, and worse than required by the glass-press mold. This was caused by poly-crystal SiC growth during hot isotropic pressing (HIP), which was confirmed from X-ray diffraction (XRD) patterns of the CVD SiC film before/after HIP. The other is silicon lost molding combined with SiC-CVD and SiC solid-state reaction bonding (SSRB). A SiC film deposited on the micromachined silicon mold was bonded with a SiC ceramic substrate using a Ni interface layer. The surface of the SiC mold was very smooth (0.004-0.008 /spl mu/m Ra) without poly-crystallization of the CVD SiC film. The SiC mold was pressed to a glass to confirm its high-temperature strength. The Pyrex glass was shaped by the SiC mold without a void, and no damage to the SiC mold was observed.
  • Keywords
    X-ray diffraction; chemical vapour deposition; hot pressing; moulding; semiconductor growth; semiconductor thin films; silicon compounds; sintering; surface roughness; wide band gap semiconductors; CVD; Ni interface layer; SiC; SiC ceramic substrate; SiC film; SiC growth; SiC microfabrication; X-ray diffraction; XRD; chemical vapor deposition; glass press mold; hot isotropic pressing; micromachined silicon mold; pyrex glass; reaction sintering; silicon carbide microfabrication; silicon lost molding; solid state reaction bonding; surface roughness; Bonding; Chemical vapor deposition; Glass; Hip; Pressing; Rough surfaces; Semiconductor films; Silicon carbide; Surface roughness; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1215301
  • Filename
    1215301