DocumentCode :
1697163
Title :
Silicon carbide microfabrication by silicon lost molding for glass press molds
Author :
Itoh, T. ; Tanaka, S. ; Jing-Feng Li ; Watanabe, R. ; Esashi, M.
Author_Institution :
Dept. of Mechatronics Precision Eng., Tohoku Univ., Sendai, Japan
Volume :
1
fYear :
2003
Firstpage :
254
Abstract :
Two novel silicon carbide (SiC) microfabrication processes for SiC glass-press molds were developed. One is silicon lost molding combined with SiC chemical vapor deposition (CVD) and SiC reaction-sintering (RS). A SiC film was deposited on a micromachined silicon mold, and backed with a SiC reaction-sintered body. The surface roughness of the SiC mold was 0.05-0.08 /spl mu/m Ra, and worse than required by the glass-press mold. This was caused by poly-crystal SiC growth during hot isotropic pressing (HIP), which was confirmed from X-ray diffraction (XRD) patterns of the CVD SiC film before/after HIP. The other is silicon lost molding combined with SiC-CVD and SiC solid-state reaction bonding (SSRB). A SiC film deposited on the micromachined silicon mold was bonded with a SiC ceramic substrate using a Ni interface layer. The surface of the SiC mold was very smooth (0.004-0.008 /spl mu/m Ra) without poly-crystallization of the CVD SiC film. The SiC mold was pressed to a glass to confirm its high-temperature strength. The Pyrex glass was shaped by the SiC mold without a void, and no damage to the SiC mold was observed.
Keywords :
X-ray diffraction; chemical vapour deposition; hot pressing; moulding; semiconductor growth; semiconductor thin films; silicon compounds; sintering; surface roughness; wide band gap semiconductors; CVD; Ni interface layer; SiC; SiC ceramic substrate; SiC film; SiC growth; SiC microfabrication; X-ray diffraction; XRD; chemical vapor deposition; glass press mold; hot isotropic pressing; micromachined silicon mold; pyrex glass; reaction sintering; silicon carbide microfabrication; silicon lost molding; solid state reaction bonding; surface roughness; Bonding; Chemical vapor deposition; Glass; Hip; Pressing; Rough surfaces; Semiconductor films; Silicon carbide; Surface roughness; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
Type :
conf
DOI :
10.1109/SENSOR.2003.1215301
Filename :
1215301
Link To Document :
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