Title :
Generating march tests automatically
Author :
van de Goor, A.J. ; Smit, B.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective
Keywords :
automatic testing; fault diagnosis; fault location; finite state machines; integrated circuit modelling; logic testing; random-access storage; trees (mathematics); RAM; automatic test generation; connectivity matrix; fault coverage; fault modelling; fault models; finite state machine; linked faults; march tests; memory tests; programming language C; q-faults; state transition; test time; Automata; Automatic testing; Computer languages; Decoding; Fault detection; Mathematical model; Performance evaluation; Read-write memory; Writing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528034
