DocumentCode
1697205
Title
Generating march tests automatically
Author
van de Goor, A.J. ; Smit, B.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear
34608
Firstpage
870
Lastpage
878
Abstract
Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective
Keywords
automatic testing; fault diagnosis; fault location; finite state machines; integrated circuit modelling; logic testing; random-access storage; trees (mathematics); RAM; automatic test generation; connectivity matrix; fault coverage; fault modelling; fault models; finite state machine; linked faults; march tests; memory tests; programming language C; q-faults; state transition; test time; Automata; Automatic testing; Computer languages; Decoding; Fault detection; Mathematical model; Performance evaluation; Read-write memory; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528034
Filename
528034
Link To Document