Title :
Testing two generations of HDTV decoders-the impact of boundary scan test
Author :
Eerenstein, Lars
Author_Institution :
Philips Electron. Design & Tools, Eindhoven, Netherlands
Abstract :
Two generations of High Definition Television decoders have been developed and produced. Boundary scan test was successfully implemented in the latter generation, and proved to be the design for test solution for the future
Keywords :
application specific integrated circuits; boundary scan testing; decoding; high definition television; integrated circuit testing; printed circuit testing; production testing; telecommunication standards; television equipment; television standards; ASIC; ATPG; HDTV decoders; High Definition Television; PCB; boundary scan test; cost; functional test; structured test; Application specific integrated circuits; Circuit testing; Decoding; Electrical fault detection; Electronic equipment testing; Fault detection; HDTV; Production; Sequential analysis; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528040
