Title :
Full symbolic ATPG for large circuits
Author :
Cabodi, Gianpiero ; Camurati, Paolo ; Quer, Stefano
Author_Institution :
Politecnico di Torino, Italy
Abstract :
Until now, symbolic FSM state space exploration techniques were limited to small circuits. This paper presents a combination of approximate forward and exact backward traversal that handles larger circuits. For the first time, we have been able to generate test patterns for or to tag as undetectable the faults of some ISCAS´89 and MCNC benchmarks never considered before
Keywords :
automatic testing; fault diagnosis; formal verification; logic testing; performance evaluation; sequential circuits; state-space methods; symbolic substitution; FSM state space exploration; ISCAS´89; MCNC benchmarks; finite state machine; sequential circuits; standard traversal algorithm; symbolic ATPG; test patterns generation; Automatic test pattern generation; Circuit faults; Circuit testing; Flip-flops; Logic testing; Reachability analysis; Sequential analysis; Sequential circuits; State-space methods; Test pattern generators;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528047
