Full symbolic ATPG for large circuits

Author

Cabodi, Gianpiero ; Camurati, Paolo ; Quer, Stefano

Author_Institution

Politecnico di Torino, Italy

fYear

34608

Firstpage

980

Lastpage

988

Abstract

Until now, symbolic FSM state space exploration techniques were limited to small circuits. This paper presents a combination of approximate forward and exact backward traversal that handles larger circuits. For the first time, we have been able to generate test patterns for or to tag as undetectable the faults of some ISCAS´89 and MCNC benchmarks never considered before

Keywords

automatic testing; fault diagnosis; formal verification; logic testing; performance evaluation; sequential circuits; state-space methods; symbolic substitution; FSM state space exploration; ISCAS´89; MCNC benchmarks; finite state machine; sequential circuits; standard traversal algorithm; symbolic ATPG; test patterns generation; Automatic test pattern generation; Circuit faults; Circuit testing; Flip-flops; Logic testing; Reachability analysis; Sequential analysis; Sequential circuits; State-space methods; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1994. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2103-0

Type

conf

DOI

10.1109/TEST.1994.528047

Filename

528047

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1697510