• DocumentCode
    1697547
  • Title

    Reliability issues of Pb-free solder joints in electronic packaging technology

  • Author

    Tu, K.N. ; Zeng, K.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., California Univ., Los Angeles, CA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1194
  • Lastpage
    1200
  • Abstract
    At present, the electronic packaging industry is actively searching for Pb-free solders due to environmental concerns surrounding the Pb-containing solders. Due to the lack of reliability data, some electronics companies are reluctant to adopt Pb-free solders into their products. Hence, a review of the reliability issues of Pb-free solders is timely. We have selected three topics to be reviewed here. They are interfacial reaction between Pb-free solder and thin film under-bump metallization, electromigration in Pb-free flip chip solder joints, and Sn whisker growth on the Pb-free finish on a Cu leadframe.
  • Keywords
    electromigration; environmental factors; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microassembling; soldering; surface chemistry; surface treatment; whiskers (crystal); Cu leadframe; Pb; Pb-containing solders; Pb-free finish; Pb-free flip chip solder joints; Pb-free solder joints; Sn whisker growth; electromigration; electronic packaging industry; electronic packaging technology; environmental concern; interfacial reaction; reliability; reliability data; thin film under-bump metallization; Electronics industry; Electronics packaging; Environmentally friendly manufacturing techniques; Gold alloys; Lead; Legislation; Manufacturing industries; Soldering; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008258
  • Filename
    1008258