Title :
Reliability issues of Pb-free solder joints in electronic packaging technology
Author :
Tu, K.N. ; Zeng, K.
Author_Institution :
Dept. of Mater. Sci. & Eng., California Univ., Los Angeles, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
At present, the electronic packaging industry is actively searching for Pb-free solders due to environmental concerns surrounding the Pb-containing solders. Due to the lack of reliability data, some electronics companies are reluctant to adopt Pb-free solders into their products. Hence, a review of the reliability issues of Pb-free solders is timely. We have selected three topics to be reviewed here. They are interfacial reaction between Pb-free solder and thin film under-bump metallization, electromigration in Pb-free flip chip solder joints, and Sn whisker growth on the Pb-free finish on a Cu leadframe.
Keywords :
electromigration; environmental factors; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microassembling; soldering; surface chemistry; surface treatment; whiskers (crystal); Cu leadframe; Pb; Pb-containing solders; Pb-free finish; Pb-free flip chip solder joints; Pb-free solder joints; Sn whisker growth; electromigration; electronic packaging industry; electronic packaging technology; environmental concern; interfacial reaction; reliability; reliability data; thin film under-bump metallization; Electronics industry; Electronics packaging; Environmentally friendly manufacturing techniques; Gold alloys; Lead; Legislation; Manufacturing industries; Soldering; Temperature; Tin;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008258