Title :
Integration of design, manufacturing and testing
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Traditionally, the majority of testing methodologies have been based on the application of ever more powerful testers-designed acid fabricated to test ever faster and more complex ICs. Such a product-driven and tester-focused testing paradigm has been on one hand technically successful but on the other hand has fueled a dramatic increase in testing costs. Hence, the question: “is it possible to increase testers´ performance maintaining at the same time testing costs on an acceptable level?” seems to be a key in predicting the future of IC testing
Keywords :
design for manufacture; design for testability; integrated circuit testing; IC testing; VLSI; complex IC; design; product-driven testing; testing costs; Circuit testing; Controllability; Costs; Electronic equipment testing; Hardware; Integrated circuit testing; Manufacturing; Observability; Semiconductor device testing; Size measurement;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528051
