DocumentCode :
1697634
Title :
A semi-naive Bayes model to forecast the probability distribution of excess returns in the U.S. stock market
Author :
Khosravani, Reza
Author_Institution :
Dept. of Electr. & Comput. Eng., American Univ. in Dubai, Dubai, United Arab Emirates
fYear :
2012
Firstpage :
1
Lastpage :
5
Abstract :
In this paper, a semi-naive Bayes method to forecast the distribution of future excess returns of stocks in a multi-dimensional variable space is presented. Unlike regression models, the proposed model takes into account both the nonlinearity and the interaction between the variables. The conditional probability distributions of excess returns for the largest 1500 U.S. stocks are numerically estimated using only historical price and volume data. The probability distributions are then used to calculate the expected returns as a function of 20 variables. The model predictions are tested with a market neutral portfolio comprised of 21 long and 21 short stocks with an average turnover of one month. An average annual return of 31.8% with a Sharpe ratio of 2.34 was obtained over a 20-year time period, from 1987 to 2006.
Keywords :
Bayes methods; forecasting theory; investment; pricing; stock markets; Sharpe ratio; U.S. stock market; average annual returns; conditional probability distributions; excess return probability distribution forecasting; historical price; long-stocks; market neutral portfolio; model predictions; multidimensional variable space; numerical estimation; seminaive Bayes model; short-stocks; variable interaction; variable nonlinearity; volume data; Data models; Estimation; Neural networks; Numerical models; Portfolios; Predictive models; Probability distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence for Financial Engineering & Economics (CIFEr), 2012 IEEE Conference on
Conference_Location :
New York, NY
ISSN :
PENDING
Print_ISBN :
978-1-4673-1802-0
Electronic_ISBN :
PENDING
Type :
conf
DOI :
10.1109/CIFEr.2012.6327815
Filename :
6327815
Link To Document :
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