DocumentCode
1698057
Title
Three-dimensional very thin stacked packaging technology for SiP
Author
Yano, Yuji ; Sugiyama, Takuya ; Ishihara, Seiji ; Fukui, Yasuki ; Juso, Hiroyuki ; Miyata, Koji ; Sota, Yoshiki ; Fujita, Kazuya
Author_Institution
Dept. Packaging Dev., Sharp Corp., Tenri, Japan
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
1329
Lastpage
1334
Abstract
In order to achieve the greater compactness, lightness, high- and multi-functionality required of mobile equipment and other electronic devices, we have developed 3D packaging technology which enables free stacking, at the package level, of ultra-thin CSP (which contain 2 or 1 LSI chip(s)). By stacking at the package level, there are no yield problems, and it is easy to perform independent electrical testing, so it is possible to achieve multi-level stacking while freely combining different kinds of LSI chips like memory or ASIC. By making chips and resin molding thinner, lowering wire loops and optimizing the package structure, we achieved higher package density: a single unit (2 chips) package height of 0.55 mmMax., 2 layers (4 chips) with a unit package height of 1.0 mmMax., and 3 layers (6 chips) with a unit package height of 1.5 mmMax. This technology makes it possible to offer ultra-compact systems-in-package (logic + memory) and high-capacity composite memories.
Keywords
chip scale packaging; integrated circuit interconnections; integrated circuit testing; large scale integration; moulding; multichip modules; 0.55 mm; 1 mm; 1.5 mm; 3D packaging technology; 3D very thin stacked packaging technology; ASIC; LSI chips; SiP; compactness; electronic devices; free package level stacking; high-capacity composite memories; independent electrical testing; memory chips; mobile equipment; multi-functionality; multi-level stacking; package density; package height; package structure; resin molding; ultra-compact logic/memory systems-in-package; ultra-thin CSP stacking; wire loops; Application specific integrated circuits; Chip scale packaging; Electronics packaging; Large scale integration; Packaging machines; Performance evaluation; Resins; Stacking; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008278
Filename
1008278
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