Title :
FDTD- based TTEM Cell field distribution
Author :
Liu, Lina ; Zhu, Feng ; Ouyang, Juan ; Zhao, Guoqun
Author_Institution :
Coll. of Electr. Eng., Southwest Jiaotong Univ., Chengdu
Abstract :
By taking advantage of FDTD with Murpsilas 2 order absorbing boundary condition, this paper made specific analysis on the field distribution of the principal part of TTEM cell. The relationship among the dimension of EUT (equipment under test) and the evenness of field distribution and the characteristic impedances are given. This can provide theoretical basis for the design of TTEM cell.
Keywords :
TEM cells; electronic equipment testing; finite difference time-domain analysis; EUT dimension; FDTD; Mur 2 order boundary condition; TTEM cell field distribution; equipment under test dimension; finite difference time-domain analysis; triple transverse electromagnetic cell; Aluminum; Boundary conditions; Conductors; Educational institutions; Finite difference methods; Impedance; Lattices; TEM cells; Testing; Time domain analysis;
Conference_Titel :
Automation Congress, 2008. WAC 2008. World
Conference_Location :
Hawaii, HI
Print_ISBN :
978-1-889335-38-4
Electronic_ISBN :
978-1-889335-37-7
