DocumentCode :
1698232
Title :
Characterization of flip chip assembly utilizing wafer applied underfill
Author :
Yala, Nadia ; Danvir, Jan ; Qi, Jing ; Kulkarni, Prasanna ; Crane, Larry ; Konarski, Mark ; Yaeger, Erin ; Tishkoff, Rebecca ; Krug, Paul ; Johnson, R. Wayne
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1380
Lastpage :
1384
Abstract :
The Motorola Advanced Technology Center, Loctite Electronic Materials and Auburn University are engaged in a NIST-ATP sponsored Joint Venture partnership to develop wafer-applied underfill materials and processes that will ultimately circumvent the need for any type of underfill dispense and cure processes on the surface mount line. Of key importance for wafer-applied underfill technology is the ability to form solder joints while immersed in the pre-applied underfill, with the proper balance of buoyant solder forces and surface tension/wetting forces between the underfill and the printed circuit board materials (core material, solder mask, and trace metallization). The focus of the present work is on the performance of the underfill material during the reflow process.
Keywords :
encapsulation; flip-chip devices; masks; printed circuit manufacture; reflow soldering; surface mount technology; wetting; Auburn University; Loctite Electronic Materials; Motorola Advanced Technology Center; buoyant solder forces; flip chip assembly; pre-applied underfill; printed circuit board materials; solder joints; solder mask; surface mount line; surface tension/wetting forces; trace metallization; wafer applied underfill; Assembly; Flip chip; Inorganic materials; International collaboration; Joining materials; Metallization; Printed circuits; Soldering; Surface tension; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008286
Filename :
1008286
Link To Document :
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