Title :
Efficient adaptive voltage scaling system through on-chip critical path emulation
Author :
Elgebaly, Mohamed ; Sachdev, Manoj
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
Conventional voltage scaling techniques rely on the characterization and monitoring of a unique critical path. However, the uniqueness of the critical path is a difficult requirement to establish in modern VLSI technologies due to the growing impact of process variations and interconnect parasitics on delay. This paper presents an on-chip critical path emulator architecture which tracks the changing critical path. The ability to emulate the actual critical path recovers most of the large margin added by conventional systems to guarantee a robust operation at all conditions. Due to the reduced margin, the proposed architecture is up to 43% and 23% more energy efficient compared to conventional open-loop and closed-loop voltage scaling systems respectively.
Keywords :
CMOS integrated circuits; VLSI; delays; electric potential; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; low-power electronics; VLSI technologies; adaptive voltage scaling system; changing critical path tracking; closed-loop voltage scaling systems; critical path margin; critical path uniqueness; delay; energy efficient architecture; interconnect parasitics; on-chip critical path emulation; on-chip critical path emulator architecture; open-loop voltage scaling systems; process variations; robust operation; Adaptive systems; Delay lines; Dynamic voltage scaling; Emulation; Frequency; Pipelines; Ring oscillators; Robustness; System-on-a-chip; Table lookup;
Conference_Titel :
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
1-58113-929-2
DOI :
10.1109/LPE.2004.1349369