Title :
Research on the interfacial reaction between anisotropically conductive film and bumpless die
Author :
Zhang, J.H. ; Chan, Y.C. ; Zeng, Z.M. ; Chiu, Y.W.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper systematically discusses the influence of bonding pressure, bonding temperature and humidity on the adhesion strength of bumpless die (aluminum surface) with two kinds of Anisotropically Conductive Films (ACFs). Evaluated by die shear test, the adhesion. strength between the ACFs and aluminum is not affected seriously by bonding pressure but it increases when bonding temperature increases. Adhesion strength at the ACF/aluminum interface increases while the adhesion at the ACF/glass surface decreases after aging in the same high temperature and high humidity environment. For the ACF/aluminum layer, the adhesion enhancement mechanism after humidity aging is studied by SAM, SEM & EDX, and XPS. Moisture mainly diffused into aluminum and resulted in an oxidation reaction, instead of diffusing into adhesive to make it swell. Less swelling of adhesive and less delamination occurred at the ACF/aluminum surface. Thus, the adhesion strength of shear samples increased after temperature/humidity exposure. In addition, the oxidation reaction can provide a fresh rougher surface that may enhance adhesion strength.
Keywords :
X-ray chemical analysis; X-ray photoelectron spectra; acoustic microscopy; adhesion; adhesives; ageing; conducting polymers; contact resistance; delamination; environmental testing; filled polymers; humidity; moisture; oxidation; packaging; polymer films; scanning electron microscopy; ACF/glass surface; Al; Al surface; EDX; SAM; SEM; XPS; adhesion enhancement mechanism; adhesion strength; adhesive swelling; aging; anisotropically conductive film; bonding pressure; bonding temperature; bumpless die; delamination; die shear test; high temperature high humidity environment; humidity; interfacial reaction; moisture diffusion; oxidation reaction; Adhesives; Aging; Aluminum; Anisotropic magnetoresistance; Bonding; Conductive films; Humidity; Oxidation; Rough surfaces; Temperature;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008316