DocumentCode
1699179
Title
Memory trends
Author
Chandra, Vikas ; Andre, Tom
Author_Institution
ARM, UK
fYear
2009
Firstpage
1
Lastpage
2
Abstract
A wide variety of memory topics addressing design trends at advanced technology nodes. Variation tolerant and low power approaches are discussed as well as their application to SRAM, DRAM, Non-volatile memories and DDR5 interfaces.
Keywords
CMOS process; Calibration; Degradation; Digital control; Impedance; Nonvolatile memory; Random access memory; Signal processing; Testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location
San Jose, CA, USA
Print_ISBN
978-1-4244-4071-9
Electronic_ISBN
978-1-4244-4073-3
Type
conf
DOI
10.1109/CICC.2009.5280730
Filename
5280730
Link To Document