Title :
Pull testing of lead-free QFP solder joints
Author :
Sundelin, Janne J. ; Nurmi, Sami T. ; Lepistö, Toivo K. ; Ristolainen, Eero O.
Author_Institution :
Inst. of Mater. Sci., Tampere Univ. of Technol., Finland
fDate :
6/24/1905 12:00:00 AM
Abstract :
Eutectic 63Sn/37Pb solder has been the dominant soldering material in the joints of electronic components for decades. The harmful impact of lead on environment and human health has, however, led to an international trend to ban Pb from all electronic products. Efforts have been made to find a viable lead-free solder for replacing tin-lead. The SnPb replacing lead-free solder should have good enough mechanical properties both in the as-soldered condition and in the service. Many studies have shown that SnAgCu solder is one of the most promising soldering materials. This paper concentrates on determining the best composition of SnAgCu solder paste to guarantee reliable joints between substrate and components. QFPs (quad flat packages) with Ni/Pd/Au plating were reflow soldered on NiAu plated circuit boards. The used lead-free solder compositions were 96.9Sn/2.7Ag/0.4Cu, 95.5Sn/3.8Ag/0.7Cu and 95.5Sn/4.0Ag/0.5Cu. Eutectic SnPb 63Sn/37Pb solder paste was used as a reference. The pull strength, microstructure and fracture surfaces of the joints after pull tests were examined in the as-reflowed condition and after 2500 thermal cycles.
Keywords :
copper alloys; fracture; mechanical testing; printed circuit manufacture; reflow soldering; reliability; silver alloys; surface mount technology; tin alloys; NiAu; QFP solder joints; SnAgCu; as-reflowed condition; circuit boards; fracture surfaces; lead-free solder; mechanical properties; pull strength; pull testing; quad flat packages; reflow soldering; reliable joints; soldering material; thermal cycles; Electronic components; Electronics packaging; Environmentally friendly manufacturing techniques; Gold; Humans; Joining materials; Lead; Mechanical factors; Soldering; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008324