DocumentCode
1699722
Title
Analysis of lossy systems via 2D-FDTD and ESPRIT
Author
Liu, F. ; Schutt-Aine, J.E. ; Chen, J.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
4
fYear
2001
Firstpage
154
Abstract
The two-dimensional finite difference time domain method has been introduced as an efficient full-wave method for waveguide structures which are uniform in the direction of wave propagation. Liu, Schutt-Aine and Chen (see IEEE AP-S, p.1074-1077, 1999) used signal processing techniques such as ESPRIT as a post-processing engine to extract the frequency domain information from the sampling data. Due to the consideration of the analytical nature of the solution, this technique reduces the computational time dramatically. A combination of the 2D-FDTD and signal processing techniques reduce the memory size and CPU time at the same time. We extend the algorithm of Liu et al. to lossy systems. The dielectric and conductor losses are both included in one analysis. The super-resolution algorithms from signal processing techniques are employed in the temporal domain to extract the parameters from the sampled data in a shorter simulation.
Keywords
MIS structures; dielectric losses; finite difference time-domain analysis; signal resolution; signal sampling; waveguide theory; 2D-FDTD; CPU time reduction; ESPRIT; computational time reduction; conductor losses; dielectric losses; efficient full-wave method; finite difference time domain method; frequency domain information extraction; lossy systems; memory size reduction; metal-insulator-semiconductor structure; post-processing engine; sampling data; signal processing; simulation; super-resolution algorithms; temporal domain; wave propagation direction; waveguide structures; Conductors; Data mining; Dielectric losses; Engines; Finite difference methods; Frequency domain analysis; Signal processing; Signal processing algorithms; Signal sampling; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7070-8
Type
conf
DOI
10.1109/APS.2001.959422
Filename
959422
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