DocumentCode :
1700114
Title :
A 6-bit 500-Ms/s digital self-calibrated pipelined analog-to-digital converter
Author :
Chen, Yu-Hsun ; Lee, Tai-Cheng
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2004
Firstpage :
98
Lastpage :
101
Abstract :
A 6-bit 500-Ms/s digital self-calibrated pipelined A/D converter is presented. Employing open-loop amplifiers in one bit conversion per stage architecture, the circuit operates in high speed and low power consumption. Using constant-gm biasing technique, the open loop amplifier is process-and-temperature insensitive. Comparator offset and full-scale error are removed by digital self-calibrated correction mechanism. Designed by a 0.18-μm technology, the A/D converter operates at 500-MHz clock rate while dissipating 47 mW. The FFT simulation result shows that the SNDR is 33.52 dB at 51-MHz input frequency and 500-MSPS conversion rate.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; circuit simulation; comparators (circuits); low-power electronics; pipeline processing; transfer functions; 47 mW; CMOS process; FFT simulation; bias topology; differential dynamic comparator; digital self-calibrated correction mechanism; digital self-calibrated pipelined ADC; high speed; low power consumption; one bit conversion per stage architecture; open-loop amplifiers; static simulation; transfer characteristic; Analog-digital conversion; Bandwidth; Circuits; Differential amplifiers; Energy consumption; Error correction; High power amplifiers; Power amplifiers; Power engineering and energy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced System Integrated Circuits 2004. Proceedings of 2004 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-8637-X
Type :
conf
DOI :
10.1109/APASIC.2004.1349417
Filename :
1349417
Link To Document :
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