DocumentCode :
1700149
Title :
A monolithic buck converter using differentially enhanced duty ripple control
Author :
Fan, Jiwei ; Li, Xuening ; Park, Jinseok ; Huang, Alex
Author_Institution :
North Carolina State Univ., Raleigh, NC, USA
fYear :
2009
Firstpage :
527
Lastpage :
530
Abstract :
This paper reports a monolithic DC-DC buck converter using the differentially enhanced duty ripple control (DE-DRC). Without any compensation circuit, this converter is stable over a wide input and output range. The switching frequency is kept constant by adjusting the on-time according to the input and output voltage. Because of the large duty ripple voltage with a big noise margin, the DE-DRC buck converter has better noise immunity than current mode and hysteretic control. The easily configured positive and negative differential difference amplifier (DDA) gains (Kp and Kn) can adjust the high and low frequency portion of the loop transfer function to achieve fast load transient response. Load transient test also showed 5 mOmega pure resistive output impedance of this converter to achieve the adaptive voltage position (AVP) function. We demonstrated a 1.85 MHz single phase converter with wide conversion range of 10%-86.6%. This circuit was implemented in 0.5 mum BCD process of TI.
Keywords :
DC-DC power convertors; differential amplifiers; monolithic integrated circuits; switching convertors; transfer functions; transient response; BCD process; DC-DC buck converter; adaptive voltage position function; differentially enhanced duty ripple control; fast load transient response; frequency 1.85 MHz; hysteretic control; loop transfer function; monolithic buck converter; negative differential difference amplifier gains; phase converter; size 0.5 mum; switching frequency; Buck converters; Circuit noise; Circuit testing; Differential amplifiers; Hysteresis; Low-frequency noise; Switching frequency; Transfer functions; Transient response; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
Type :
conf
DOI :
10.1109/CICC.2009.5280760
Filename :
5280760
Link To Document :
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