Title :
Controlled modification of micromachined silicon surfaces using colloidal micro-and nanoparticles
Author :
Srikar, V.T. ; Peles, Y. ; Arana, L.R. ; Spearing, S.M.
Author_Institution :
Dept. of Aeronaut. & Astronaut., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
We report a processing technique, based on convective self-assembly, to form densely packed, ordered, arrays of colloidal micro-and nanoparticles on the internal surfaces of geometrically complex, bulk-micromachined, silicon structures. The self-assembled layers exhibit excellent surface coverage and a low density of crystallographic defects. This method can access a wide range of chemistries, particle sizes, and layer thickness. Potential applications include the formation of porous thin film platforms for biomolecules and catalysts; incorporation of catalytic particles inside microreactors; and colloidal lithography. The principal results are summarized in the form of design guidelines.
Keywords :
catalysts; colloids; domain boundaries; elemental semiconductors; interstitials; lithography; micromachining; nanocomposites; particle size; polymer films; self-assembly; semiconductor thin films; silicon; silicon compounds; surface chemistry; surface roughness; vacancies (crystal); Si; SiO/sub 2/; assembled layers; biomolecules; bulk-micromachined surfaces; catalysts; colloidal lithography; colloidal microparticles ordered arrays; colloidal nanoparticles ordered arrays; convective self-assembly; crystallographic defects; densely packing; density; geometrically complex surfaces; internal surfaces; micromachined silicon surfaces controlled modification; microreactors; particle sizes; porous thin film platforms; silicon structures; Assembly; Chemical technology; Chemistry; Etching; Nanoparticles; Rough surfaces; Self-assembly; Silicon; Surface roughness; Surface topography;
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
DOI :
10.1109/SENSOR.2003.1215576