DocumentCode :
1700269
Title :
Microsystems for the fabrication of nano-scale structures
Author :
Courcimault, C.G. ; Kercher, D.S. ; Allen, M.G.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
1
fYear :
2003
Firstpage :
730
Abstract :
This paper describes fabrication and testing of microsystems which can be utilized for in-situ deposition control and direct patterning of structures with micron and submicron lateral and vertical dimensions. An electrostatically-driven microactuator acts as an addressable active shutter and shadow mask in a Physical Vapor Deposition system. The displacement of the actuator is controlled in the nano-scale range, without using electrical sensing circuitry, by means of ´stoppers´ fabricated as integral parts of the structure. The deposition of metals through the real-time-actuated microsystem allowed control of the three dimensional shape of the deposited patterns as verified by AFM measurements.
Keywords :
atomic force microscopy; electrostatic actuators; masks; nanostructured materials; nanotechnology; plasma CVD; thin films; AFM; addressable active shutter; electrostatically-driven microactuator; microsystems testing; nanoscale structures; physical vapor deposition; real-time-actuated microsystem; shadow mask; structures direct patterning; submicron lateral dimensions; submicron vertical dimensions; three dimensional shape control; Actuators; Chemical vapor deposition; Circuits; Displacement control; Fabrication; Microactuators; Nanostructures; Shape control; Shape measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
Type :
conf
DOI :
10.1109/SENSOR.2003.1215577
Filename :
1215577
Link To Document :
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