Title :
Lithographic approach to pattern multiple nanoparticle thin films prepared by Layer-by-Layer self-assembly for microsystems
Author :
Tianhong Cui ; Lvov, Y. ; Feng Hua ; Jingshi Shi
Author_Institution :
Inst. for Micromanuf., Louisiana Tech. Univ., Ruston, LA, USA
Abstract :
We report a lithographic approach to pattern multiple types of Layer-by-Layer self-assembled nanoparticle thin films. 150 nm and 64 nm polystyrene particles are separated in desired patterns with a feature size 5 to 20 microns. The process is quite simple, consisting of only two consecutive lift-offs, and there is no high requirement for the equipments. This method can be applied to various types of nanoparticles. Since it is based on the conventional lithographic technique, it provides a simple, reliable, and cheap method for complex microsystem fabrication which is composed mainly of functional nanoparticles for the applications to sensing and actuation in micro/nano scale.
Keywords :
atomic layer deposition; lithography; micromechanical devices; nanoparticles; nanotechnology; polymer films; self-assembly; 150 nm; 5 to 20 micron; 64 nm; actuation; complex microsystem fabrication; consecutive lift-offs; layer-by-layer self-assembly; lithography; microscale; nanoscale; pattern multiple nanoparticle thin films; polystyrene particles; reliable method; sensing; Adhesives; Biomedical optical imaging; Lithography; Nanoparticles; Optical device fabrication; Optical films; Optical sensors; Self-assembly; Silicon compounds; Transistors;
Conference_Titel :
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7731-1
DOI :
10.1109/SENSOR.2003.1215579