Title :
A 65nm CMOS, ring-oscillator based, high accuracy Digital Phase Lock Loop for USB2.0
Author :
Kamath, Anant S. ; Chattopadhyay, Biman ; Nayak, Gopalkrishna
Author_Institution :
Texas Instrum. India Pvt. Ltd., TX, USA
Abstract :
A high accuracy, ring-oscillator based Digital Phase Lock Loop (DPLL), suitable for USB2.0 application, is presented here. The Digitally Controlled Oscillator (DCO) of the DPLL consists of a current mode Digital to Analog Converter (DAC) combined with a Current Controlled Oscillator (ICO). Sigma-Delta (SigmaDelta) dithering is used on the DAC for improved frequency accuracy. To reduce noise due to SigmaDelta dithering and to allow for passive filtering of this noise, the SigmaDelta section of the DAC is limited to a small range. This range, however, is not sufficient to account for frequency drifts due to temperature: a novel temperature compensation scheme is used for this purpose. The DPLL is built in 65 nm technology, and provides a 480 MHz output, with a phase noise of -103.5 dBc/Hz at 1 MHz offset, and a frequency accuracy of +/-100 ppm. It supports a list of input frequencies: 13 MHz, 12 MHz, 19.2 MHz, 24 MHz and 48 MHz, occupies a die area of 0.21 sq mm, and does not require external components.
Keywords :
CMOS digital integrated circuits; compensation; current-mode circuits; digital control; digital phase locked loops; digital-analogue conversion; integrated circuit noise; phase locked oscillators; phase noise; CMOS technology; USB2.0 application; current controlled oscillator; current mode digital to analog converter; digitally controlled oscillator; frequency 12 MHz; frequency 13 MHz; frequency 19.2 MHz; frequency 24 MHz; frequency 48 MHz; frequency 480 MHz; frequency drifts; high accuracy DPLL; passive filtering; phase noise; ring-oscillator based digital phase lock loop; size 65 nm; temperature compensation scheme; Delta-sigma modulation; Digital control; Digital-analog conversion; Filtering; Frequency; Noise reduction; Oscillators; Passive filters; Phase noise; Temperature distribution;
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
DOI :
10.1109/CICC.2009.5280765