Title :
Analog VLSI Neural Network Testing
Author :
Redford, M.A. ; Nagvajara, Prawat
Author_Institution :
Department of Electrical and Computer, Engineering, Drexel University, Philadelphia, Pennsylvania
Keywords :
Application software; Artificial neural networks; Circuit faults; Circuit testing; History; Neural networks; Neurons; Supervised learning; Unsupervised learning; Very large scale integration;
Conference_Titel :
Aerospace Control Systems, 1993. Proceedings. The First IEEE Regional Conference on
DOI :
10.1109/AEROCS.1993.721048
