DocumentCode
1700577
Title
Test strategies for adaptive equalizers
Author
Cheng, Kwang-Ting ; Chang, Hsiu-Ming
Author_Institution
Univ. of California, Santa Barbara, CA, USA
fYear
2009
Firstpage
597
Lastpage
604
Abstract
This paper provides an overview of the test strategies for both continuous-time and digitally-assisted adaptive equalizers. Conventionally, an equalizer is characterized by the explicit measurement of the eye diagram at its output, which requires a lengthy testing time and is too costly for production testing. Design for testability and special test stimuli have been developed to facilitate circuit performance characterization and go/no-go production testing. In addition, for digitally assisted adaptive equalizers, digital signatures extracted from the tap coefficients in the digital adaptation unit can be used for performance prediction and fault detection.
Keywords
adaptive equalisers; continuous time systems; digital signatures; fault location; adaptive equalizers; continuous-time equalizers; digital adaptation unit; digital signatures; digitally-assisted equalizers; explicit measurement; eye diagram; fault detection; Adaptive equalizers; Circuit optimization; Circuit testing; Design for testability; Digital signatures; Electrical fault detection; Length measurement; Production; Signal analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-4071-9
Electronic_ISBN
978-1-4244-4073-3
Type
conf
DOI
10.1109/CICC.2009.5280777
Filename
5280777
Link To Document