• DocumentCode
    1700577
  • Title

    Test strategies for adaptive equalizers

  • Author

    Cheng, Kwang-Ting ; Chang, Hsiu-Ming

  • Author_Institution
    Univ. of California, Santa Barbara, CA, USA
  • fYear
    2009
  • Firstpage
    597
  • Lastpage
    604
  • Abstract
    This paper provides an overview of the test strategies for both continuous-time and digitally-assisted adaptive equalizers. Conventionally, an equalizer is characterized by the explicit measurement of the eye diagram at its output, which requires a lengthy testing time and is too costly for production testing. Design for testability and special test stimuli have been developed to facilitate circuit performance characterization and go/no-go production testing. In addition, for digitally assisted adaptive equalizers, digital signatures extracted from the tap coefficients in the digital adaptation unit can be used for performance prediction and fault detection.
  • Keywords
    adaptive equalisers; continuous time systems; digital signatures; fault location; adaptive equalizers; continuous-time equalizers; digital adaptation unit; digital signatures; digitally-assisted equalizers; explicit measurement; eye diagram; fault detection; Adaptive equalizers; Circuit optimization; Circuit testing; Design for testability; Digital signatures; Electrical fault detection; Length measurement; Production; Signal analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280777
  • Filename
    5280777