DocumentCode :
1700577
Title :
Test strategies for adaptive equalizers
Author :
Cheng, Kwang-Ting ; Chang, Hsiu-Ming
Author_Institution :
Univ. of California, Santa Barbara, CA, USA
fYear :
2009
Firstpage :
597
Lastpage :
604
Abstract :
This paper provides an overview of the test strategies for both continuous-time and digitally-assisted adaptive equalizers. Conventionally, an equalizer is characterized by the explicit measurement of the eye diagram at its output, which requires a lengthy testing time and is too costly for production testing. Design for testability and special test stimuli have been developed to facilitate circuit performance characterization and go/no-go production testing. In addition, for digitally assisted adaptive equalizers, digital signatures extracted from the tap coefficients in the digital adaptation unit can be used for performance prediction and fault detection.
Keywords :
adaptive equalisers; continuous time systems; digital signatures; fault location; adaptive equalizers; continuous-time equalizers; digital adaptation unit; digital signatures; digitally-assisted equalizers; explicit measurement; eye diagram; fault detection; Adaptive equalizers; Circuit optimization; Circuit testing; Design for testability; Digital signatures; Electrical fault detection; Length measurement; Production; Signal analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
Type :
conf
DOI :
10.1109/CICC.2009.5280777
Filename :
5280777
Link To Document :
بازگشت