• DocumentCode
    1700764
  • Title

    Technique for preparing defect-free spray coated resist film

  • Author

    Kumar Singh, V. ; Sasaki, M. ; Jong Hyeong Song ; Hane, K.

  • Author_Institution
    Dept. of Mechatronics & Precision Eng., Tohoku Univ., Sendai, Japan
  • Volume
    1
  • fYear
    2003
  • Firstpage
    817
  • Abstract
    Up to now some 3-D (three-dimensional) devices have been demonstrated using the spray coating of photoresist. Since the detail of the technical performance is not clear, the spray coating technique is still in its infancy. In this study, a technique for preparing the defect-free spray coated resist film is described. A solvent (thinner) vapor is used to fill the pinhole assisting the resist flow. Since this flow is generated by the surface tension, it degrades the uniformity of the resist film on the cavity by decreasing the thickness at convex corner. The balance between the removing effect of pinholes and the thinning effect at convex corners is examined finding the appropriate condition.
  • Keywords
    elemental semiconductors; optical scanners; photoresists; semiconductor growth; semiconductor thin films; silicon; spray coating techniques; spray coatings; surface tension; Si; convex corner; defect-free spray coated resist film; pinhole filling; resist flow; surface tension; thinning effect; Coatings; Degradation; Lithography; Mechatronics; Optical films; Resists; Spraying; Surface tension; Temperature control; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1215599
  • Filename
    1215599