DocumentCode :
1700844
Title :
A new RTL debugging methodology in FPGA-based verification platform
Author :
Yang, Sangjun ; Shim, Heejun ; Yang, Wooseung ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., KAIST, Daejon, South Korea
fYear :
2004
Firstpage :
180
Lastpage :
183
Abstract :
In this paper we present a new RTL debugging methodology in FPGA-based verification platform. This method provides internal node probing in the co-simulation environment. Full observability is guaranteed using 32-bit scan module generated automatically. Most commercial debugging tools are limited to hundreds of internal nodes for the observability in the co-simulation. The proposed method increases the observability of design to 100%. Debugging feature named in RTL gives the benefits that designers feel more comfortable in RTL than in gate level since the signal names in gate level are complicated and incomprehensive. Designers can control the depth of probing in the design hierarchy. The overheads of area and time due to improving the design observability are turned to be small for a reasonable number of internal node probing.
Keywords :
application program interfaces; boundary scan testing; computer debugging; field programmable gate arrays; formal verification; hardware description languages; hardware-software codesign; observability; reconfigurable architectures; system-on-chip; FPGA-based verification platform; HDL signal names; RTL debugging methodology; SOC; area overheads; cosimulation environment; design hierarchy; high-performance verification; iPROVE C-based API; internal node probing; observability; probing depth; reconfigurable hardware; scan module; time overheads; Acceleration; Circuits; Communication system control; Field programmable gate arrays; Flip-flops; Hardware; Observability; Signal design; Software debugging; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced System Integrated Circuits 2004. Proceedings of 2004 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-8637-X
Type :
conf
DOI :
10.1109/APASIC.2004.1349442
Filename :
1349442
Link To Document :
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