Title :
Two soft-error mitigation techniques for functional units of DSP processors
Author :
Rohani, A. ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Testing of Integrated Syst. Group, Univ. of Twente, Enschede, Netherlands
Abstract :
This paper presents two soft-error mitigation methods for DSP processors. Considering that a DSP processor is composed of several functional units and each functional unit constitutes of a control unit, some registers and combinational logic, a unique characteristic of DSP workloads has been deployed to develop a masking mechanism for the control-logic of each functional unit. Combinational logic has been elaborated with a fast recovery mechanism to isolate the fault-free functional units and re-execute the erroneous instruction. These techniques have been implemented on a DSP processor in order to assess the achieved fault-tolerance versus the imposed overheads.
Keywords :
combinational circuits; digital signal processing chips; fault tolerant computing; flip-flops; radiation hardening (electronics); DSP processors; DSP workloads; combinational logic; control unit; control-logic; erroneous instruction re-execution; fast recovery mechanism; fault-free functional unit isolation; masking mechanism; miniaturized CMOS technologies; registers; soft-error mitigation techniques; Clocks; Degradation; Digital signal processing; History; Program processors; Read only memory; Registers;
Conference_Titel :
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location :
Paderborn
DOI :
10.1109/ETS.2014.6847792